The patterns are manufactured from Select Ceramic. They are ideally suited for building up and calibration of Optical and other Two Dimensional X-Y Stages and Measurement Systems.

With a feature-to-feature accuracy of 1 micron, these patterns allow for extremely accurate testing and qualification of inspection systems. Please choose the dot size and spacing that suits your application best.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical rows of dots should be perpendicular to each other. A distorted image will show the array as bowed; this image can then be used to correct for distortion.

A special protection box is also provided to protect the targets during storage.